R&D Platform

COTEST core transmitter product line mainly includes: VCSEL wafer mass production VMP7000 series, narrow pulse wafer mass production VMP9000 series and module mass production test SPMT7000 series. In 2020, the company began to mainly research and develop the narrow pulse wafer mass production machine VMP9000, and the technology has been in the leading position in China. The product began to receive small-scale mass production experiments from customers in the second quarter of 2012. As end users' requirements for detection range increase, lidar manufacturers widely use multi section VCSEL devices. The power and heat dissipation brought by multi section VCSEL are the difficulties and key points in the test. VMP9000 came into being as the times require. It is an indispensable device for multi section VCSELs in wafer testing, with the excitation of hundredths of a second, and is as close as possible to the use scenario of VCSELs.

R&D Platform

Wafer/Die Tester VPS7000

The laser design verification process requires thorough testing to obtain accurate specifications. These tests require precise probing, sophisticated instrumentation, the proper methodology, and dedicated algorithms. To increase the power of the laser emitter, the emitting module uses a vertical-cavity surface-emitting laser, which is smaller, lighter, more durable, and more power efficient than other lasers. VPS7000 use the modular function design, covering the requirements of the R&D and verification of the VCSEL arrays and the requirements for the test of electrical characteristics and optical characteristics.

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R&D Platform

Light Source Package Tester SPT7000

SPT7000 series is a comprehensive test bench specially developed for laser package modules. The series uses functional modular design, including LIV module, far field test module, near field test module, image analysis module, motion control module and temperature control module. It can test and evaluate various performance indexes of laser package, including LIV electrical parameters, optical near and far fields, bad point detection, divergence angle, uniformity, temperature characteristics, etc.

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